A test point selection approach for DC analog circuits with large number of predefined faults
Author:
Publisher
Springer Science and Business Media LLC
Subject
Surfaces, Coatings and Films,Hardware and Architecture,Signal Processing
Link
http://link.springer.com/content/pdf/10.1007/s10470-019-01550-7.pdf
Reference22 articles.
1. Bandler, J. W., & Salama, A. E. (1985). Fault diagnosis of analog circuits. Proceedings of the IEEE,73, 1279–1325.
2. Prasad, V. C., & Babu, N. S. C. (2000). Selection of test nodes for analog fault diagnosis in dictionary approach. IEEE Transaction on Instrumentation and Measurement,49, 1289–1297.
3. Starzyk, J. A., Liu, D., Liu, Z.-H., Nelson, D. E., & Rutkowski, J. O. (2004). Entropy-based optimum test points selection for analog fault dictionary techniques. IEEE Transaction on Instrumentation and Measurement,53(3), 754–761.
4. Yang, C., Tian, S., Long, B., & Chen, F. (2010). A novel test point selection method for analog fault dictionary techniques. Journal of Electronic Testing,26(5), 523–534.
5. Yang, C., Tian, S., Long, B., & Chen, F. (2011). Methods of handling the tolerance and test-point selection problem for analog-circuit fault diagnosis. IEEE Transaction on Instrumentation and Measurement,60(1), 176–185.
Cited by 9 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. An Efficient Double Deep Q Learning Network-Based Soft Faults Detection and Localization in Analog Circuits;Journal of Circuits, Systems and Computers;2024-06-10
2. Design of Fault Diagnosis Method Based on Circuit Frequency Domain Characteristics Fault Dictionary Method;Journal of Physics: Conference Series;2024-03-01
3. Fault Diagnosis of Analog Circuits Based on Multi-Scale 1D Convolutional Neural Network;2023 IEEE 32nd Asian Test Symposium (ATS);2023-10-14
4. Soft Fault Diagnosis Technology of Filter Circuit Based on Heterogeneous Ensemble Learning;2023 IEEE 16th International Conference on Electronic Measurement & Instruments (ICEMI);2023-08-09
5. Test Node Selection for Fault Diagnosis in Analog Circuits using Faster RCNN Model;Circuits, Systems, and Signal Processing;2023-01-23
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3