Statistical property feature extraction based on FRFT for fault diagnosis of analog circuits
Author:
Publisher
Springer Science and Business Media LLC
Subject
Surfaces, Coatings and Films,Hardware and Architecture,Signal Processing
Link
http://link.springer.com/content/pdf/10.1007/s10470-016-0721-5.pdf
Reference21 articles.
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2. Aminian, M., & Aminian, F. (2000). Neural-network based analog-circuit fault diagnosis using wavelet transform as preprocessor. IEEE Transactions on Circuits and Systems Part II: Express Briefs, 47(2), 151–156.
3. Aminian, M., & Aminian, F. (2001). Fault diagnosis of nonlinear analog circuits using neural networks with wavelet and Fourier transforms as preprocessors. Journal of Electronic Testing, 17(6), 471–481.
4. Aminian, M., Aminian, F., & Collins, H. W. (2002). Analog fault diagnosis of actual circuits using neural networks. IEEE Transactions on Instrumentation and Measurement, 51(3), 544–550.
5. Aminian, M., & Aminian, F. (2007). A modular fault-diagnostic system for analog electronic circuits using neural networks with wavelet transform as a preprocessor. IEEE Transactions on Instrumentation and Measurement, 56(5), 1546–1554.
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