A new test points selection method for analog fault dictionary techniques-Reference-Cited by-同舟云学术

A new test points selection method for analog fault dictionary techniques

Published:2014-12-12 Issue:2 Volume:82 Page:435-448
ISSN:0925-1030
Container-title:Analog Integrated Circuits and Signal Processing
language:en
Short-container-title:Analog Integr Circ Sig Process

Author:

Zhao Dongsheng,He Yuzhu

Publisher

Springer Science and Business Media LLC

Subject

Surfaces, Coatings and Films,Hardware and Architecture,Signal Processing

Link

http://link.springer.com/content/pdf/10.1007/s10470-014-0469-8.pdf

Reference17 articles.

1. Augusto, J. S. & Almeida, C. (2006). A tool for test point selection and single fault diagnosis in linear analog circuits. In Proceeding of the XXI International Conference on Design of Systems and Integrated Systems, Barcelona, Spain.

2. Bandler, J. W., & Salama, A. E. (1981). Fault diagnosis of analog circuits. Proceedings of the IEEE, 73, 1279–1325.

3. Bandler, J. W., & Salama, A. E. (1985). Fault diagnosis of analog circuits. Proceedings of the IEEE, 73(8), 1279–1325.

4. Duhamal, P., & Rault, J. C. (1979). Automatic tests generation techniques for analog circuits and systems: A review. IEEE Transactions on Circuits and Systems I, CAS-26, 440–441.

5. Golonek, T., & Rutkowski, J. (2007). Genetic-algorithm-based method for optimal analog test points selection. IEEE Transactions on Circuits and Systems II: Express Briefs, 54(2), 117–121.

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