A general method for analog test point selection using multi-frequency analysis
Author:
Publisher
Springer Science and Business Media LLC
Subject
Surfaces, Coatings and Films,Hardware and Architecture,Signal Processing
Link
http://link.springer.com/content/pdf/10.1007/s10470-015-0565-4.pdf
Reference20 articles.
1. Manetti, S., & Piccirilli, M. C. (2003). A singular-value decomposition approach for ambiguity group determination in analog circuits. IEEE Transactions on Circuits and Systems—I: Fundamental Theory and Application, 50(4), 477–487.
2. Bandler, J. W., & Salama, A. E. (1985). Fault diagnosis of analog circuits. Proceeding of IEEE, 73(8), 1279–1325.
3. Alippi, C., Catelani, M., Fort, A., & Mugnaini, M. (2005). Automated selection of test frequencies for fault diagnosis in analog electronic circuits. IEEE Transactions on Instrumentation and Measurement, 54(3), 1033–1044.
4. Varghese, X., Williams, J. H., & Towill, D. R. (1978). Computer aided feature selection for enhanced analogue system fault location. Pattern Recognition, 10(4), 265–280.
5. Hochwald, W., & Bastian, J. D. (1979). A DC approach for analog fault dictionary determination. IEEE Transactions on Circuits and Systems, 26(7), 523–529.
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