Reply to the comment by S. Dannefaer et al. on the paper of H. E. Schaefer et al. on ?amorphous hydrogenated silicon studied by positron lifetime spectroscopy?-Reference-Cited by-同舟云学术

Reply to the comment by S. Dannefaer et al. on the paper of H. E. Schaefer et al. on ?amorphous hydrogenated silicon studied by positron lifetime spectroscopy?

Published:1987 Issue:4 Volume:43 Page:295-296
ISSN:0721-7250
Container-title:Applied Physics A Solids and Surfaces
language:en
Short-container-title:Appl. Phys. A

Author:

Schaefer H. E.,W�rschum R.,Schwarz R.,Slobodin D.,Wagner S.

Publisher

Springer Science and Business Media LLC

Subject

General Materials Science,General Chemistry,Physics and Astronomy (miscellaneous),General Engineering,General Materials Science

Link

http://link.springer.com/content/pdf/10.1007/BF00635186.pdf

Reference21 articles.

1. S. Dannefaer, P. Mascher, D. Kerr: Appl. Phys. A43, 91?92 (1987)

2. H.E. Schaefer, R. Gugelmeier, M. Schmolz, A. Seeger: InMicrostructural Characterization of Materials by Non-Microscopical Techniques, ed. by N. Kessel-Andersen et al. (Risø National Laboratory, Denmark 1984) p. 489

3. W. Fuhs, U. Holzhauer, S. Mantl, F.W. Richter, R. Sturm: Phys. Stat. Solidi (b)89, 69 (1978)

4. G.D. Watkins, J.W. Corbett: Phys. Rev.138, A543 (1965)

5. J.W. Corbett, G.D. Watkins: Phys. Rev.138, A555 (1965)

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