Characterization of the bulk defects in InP crystal with a high-resolution triple-crystal X-ray diffractometer
Author:
Publisher
Springer Science and Business Media LLC
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials,General Materials Science
Link
http://link.springer.com/content/pdf/10.1007/BF01470921.pdf
Reference27 articles.
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4. Holy, V.: Phys. Status Solidi B111, 341 (1982)
5. Holy, V.: Phys. Status Solidi B112, 161 (1982)
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