Temperature characteristics of positron trapping at defects in electron-irradiated silicon

Author:

Motoko -Kwete ,Segers D.,Dorikens M.,Dorikens-Vanpraet L.,Clauws P.,Lemahieu I.

Publisher

Springer Science and Business Media LLC

Subject

General Materials Science,General Chemistry,Physics and Astronomy (miscellaneous),General Engineering,General Materials Science

Reference22 articles.

1. J.H. Crawford Jr.: InRadiation Damage in Solids, ed. by D.S. Billington (Academic, New York 1962) pp. 333?357

2. J. Bourgoin, M. Lannoo:Point Defects in Semiconductors II, Springer Ser. Solid-State Sci.35 (Springer Berlin, Heidelberg 1983)

3. S. Dannefaer, P. Mascher, D. Kerr: Appl. Phys. A43, 91?92 (1987)

4. H.E. Schaefer, R. Wurschum, R. Schwarz, D. Slobodin, S. Wagner: Appl. Phys. A43, 295?296 (1987)

5. M.J. Puska, C. Corbel: Phys. Rev. B38, 9874 (1988)

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