Author:
Wu Muh-Cherng,Huang Y. L.,Chang Y. C.,Yang K. F.
Publisher
Springer Science and Business Media LLC
Subject
Industrial and Manufacturing Engineering,Computer Science Applications,Mechanical Engineering,Software,Control and Systems Engineering
Reference16 articles.
1. Yoon HJ, Lee DY (2000) A control method to reduce the standard deviation of flow time in wafer fabrication. IEEE Trans Semicond Manuf 13(3):389–392
2. Lee YH, Park J, and Kim S (2002) Experimental study on input and bottleneck scheduling for a semiconductor fabrication line. IEEE Trans Semicond Manuf 34(2):179–190
3. Li S, Tang T, and Colons DW (1996) Minimum inventory variability schedule with applications in semiconductor fabrication. IEEE Trans Semicond Manuf 9(1):145–149
4. Lu SCH, Ramaswamy D, and Kumar PR (1994) Efficient scheduling policies to reduce mean and variance of cycle-time in semiconductor manufacturing plant. IEEE Trans Semicond Manuf 7(3):374–388
5. Kim YD, Lee DH, Kim JU, and Roh HK (1998) A simulation study on lot release control, mask scheduling, and batch scheduling in semiconductor wafer fabrication facilities. J Manuf Syst 17(2):107–117
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