On the Relationship Between the Order of Mutation Testing and the Properties of Generated Higher Order Mutants

Author:

Nguyen Quang Vu,Madeyski Lech

Publisher

Springer Berlin Heidelberg

Cited by 12 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Predicting higher order mutation score based on machine learning;Journal of Information and Telecommunication;2023-08-31

2. Improving Fault Localization by Complex-Fault Oriented Higher-Order Mutant Generation;2023 IEEE 47th Annual Computers, Software, and Applications Conference (COMPSAC);2023-06

3. SGS: Mutant Reduction for Higher-order Mutation-based Fault Localization;2023 IEEE 47th Annual Computers, Software, and Applications Conference (COMPSAC);2023-06

4. Improving the Performance of Mutation-based Fault Localization via Mutant Bias Practical Experience Report;2022 IEEE 33rd International Symposium on Software Reliability Engineering (ISSRE);2022-10

5. Can Higher-Order Mutants Improve the Performance of Mutation-Based Fault Localization?;IEEE Transactions on Reliability;2022-06

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