SGS: Mutant Reduction for Higher-order Mutation-based Fault Localization-Reference-Cited by-同舟云学术

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SGS: Mutant Reduction for Higher-order Mutation-based Fault Localization

Published:2023-06 Issue: Volume: Page:
ISSN:
Container-title:2023 IEEE 47th Annual Computers, Software, and Applications Conference (COMPSAC)
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Author:

Fan Luxi¹,Li Zheng¹,Liu Hengyuan¹,Paul Doyle²,Wang Haifeng³,Chen Xiang⁴,Liu Yong¹

Affiliation:

1. Beijing University of Chemical Technology,College of Information Science and Technology,Beijing,China,100029

2. Technological University Dublin,School of Computer Science,Dublin,Ireland

3. National Institute of Metrology,Center for Advanced Metering Infrastructure,Beijing,China,100029

4. Nantong University,School of Information Science and Technology,Nantong,China,226019

Funder

National Natural Science Foundation of China

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10196792/10196808/10197100.pdf?arnumber=10197100

Reference23 articles.

1. Supporting Controlled Experimentation with Testing Techniques: An Infrastructure and its Potential Impact

2. Faster mutation-based fault localization with a novel mutation execution strategy

3. Is operator-based mutant selection superior to random mutant selection?

4. An experimental determination of sufficient mutant operators

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