The Improvement of March C+ Algorithm for Embedded Memory Test-Reference-Cited by-同舟云学术

The Improvement of March C+ Algorithm for Embedded Memory Test

Published:2016 Issue: Volume: Page:31-37
ISSN:1865-0929
Container-title:Communications in Computer and Information Science
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Author:

Wang Yongwen,Zheng Qianbing,Yuan Yin

Publisher

Springer Berlin Heidelberg

Link

http://link.springer.com/content/pdf/10.1007/978-3-662-49283-3_4

Reference4 articles.

1. Arden, W.M.: The international technology roadmap for semiconductors—perspectives and challenges for the next 15 years. Curr. Opin. Solid State Mater. Sci. 6, 371–377 (2002)

2. Adams, R., Cooley, E.: Analysis of a deceptive destructive read memory fault model and recommended testing. In: Proceedings of IEEE North Atlantic Test Workshop, pp. 27–32 (1996)

3. Dekker, R., Beenker, F., Thijssen, L.: A realistic fault model and test algorithms for static random access memories. IEEE Trans. Comput.-Aided Des. Integr. Circ. Syst. 9, 567–572 (1990)

4. Marinissen, E.J., Prince, B., Keltel-Schulz, D., Zorian, Y.: Challenges in embedded memory design and test. In: Proceedings of Design, Automation and Test in Europe, pp. 722–727. IEEE (2005)

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