Author:
Di Shaoyan,Shen Lei,Chang Pengying,Zhao Kai,Lu Tiao,Du Gang,Liu Xiaoyan
Publisher
Springer Science and Business Media LLC
Reference24 articles.
1. Deleonibus S. Looking into the future of Nanoelectronics in the Diversification Efficient Era. Sci China Inf Sci, 2016, 59: 061401
2. Cheng K, Khakifirooz A. Fully depleted SOI (FDSOI) technology. Sci China Inf Sci, 2016, 59: 061402
3. Natori K, Iwai H, Kakushima K. Anomalous degradation of low-field mobility in short-channel metal-oxidesemiconductor field-effect transistors. J Appl Phys, 2015, 118: 234502
4. Khandelwal S, Agarwal H, Kushwaha P, et al. Unified compact model covering drift-diffusion to ballistic carrier transport. IEEE Electron Device Lett, 2016, 37: 134–137
5. Jin S, Pham A-T, Choi W, et al. Performance evaluation of FinFETs: from multisubband BTE to DD calibration. In: Proceedings of International Conference Simulation Semicond Processes Devices, 2016. 109–116