LSB page refresh based retention error recovery scheme for MLC NAND Flash

Author:

Ma Haozhi,Liu Lifang,Pan Liyang,Xu Jun

Publisher

Springer Science and Business Media LLC

Subject

General Computer Science

Reference24 articles.

1. Choi S, Kim D, Choi S, et al. 19.2 A 93.4 mm2 64 GB MLC NAND-flash memory with 16 nm CMOS technology. In: IEEE International Solid-State Circuits Conference Digest of Technical Papers (ISSCC). San Francisco: IEEE, 2014. 328–329

2. Helm M, Park J K, Ghalam A, et al. 19.1 A 128 Gb MLC NAND-flash device using 16 nm planar cell. In: IEEE International Solid-State Circuits Conference Digest of Technical Papers (ISSCC). San Francisco: IEEE, 2014. 326–327

3. Koh Y. NAND flash scaling beyond 20 nm. In: IEEE International Memory Workshop, IMW’09. Monterey: IEEE, 2009. 1–3

4. Yoon J H, Tressler G A. Advanced flash technology status, scaling trends & implications to enterprise SSD technology enablement. In: Flash Memory Summit, Santa Clara, 2012

5. Kang D, Lee K, Seo S, et al. Generation dependence of retention characteristics in extremely scaled NAND flash memory. IEEE Electron Device Lett, 2013, 34: 1139–1141

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1. Modeling of program Vth distribution for 3-D TLC NAND flash memory;Science China Information Sciences;2019-02-21

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