1. R K Sinha and A Kakodkar, Nucl. Eng. Des. 236, 683 (2006)
2. R K Malhotra and K Suryanarayana, Talanta 50, 601 (1999)
3. M V Ramaniah, Pure Appl. Chem. 54(4), 889 (1982)
4. R E Van Grieken and A Markowicz, Handbook of X-ray spectrometry, 2nd edn (Marcel Dekker Inc., New York. 1993)
5. R Klockenkämper, Total reflection X-ray fluorescence analysis, chemical analysis (John Wiley & Sons, New York, 1996) Vol. 140