On the ability of oscillation-based test for detecting deviation faults in switched-capacitor ladder filters
Author:
Publisher
Springer Science and Business Media LLC
Subject
Applied Mathematics,Electrical and Electronic Engineering
Link
http://link.springer.com/content/pdf/10.1007/s00202-007-0065-3.pdf
Reference20 articles.
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3. Vázquez D, Rueda A, Huertas J (1994) A new strategy for testing analog filters. In: Proceedings IEEE VLSI Test Symposium, pp 36–41
4. Arabi K and Kaminska B (1999). Oscillation-test methodology for low-cost testing of active analog filters. IEEE Trans Instrum Meas 48: 798–806
5. Romero E, Peretti G, Huertas G and Vázquez D (2005). Test of switched-capacitor ladder filters using OBT. Microelectron J 36: 1073–1079
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