Oscillation-Based DFT for Second-Order Bandpass OTA-C Filters

Author:

Hasan Masood-ul,Zhu YanqingORCID,Sun Yichuang

Publisher

Springer Science and Business Media LLC

Subject

Applied Mathematics,Signal Processing

Reference41 articles.

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2. K. Arabi, B.L. Kaminska, Oscillation-test methodology for low-cost testing of active analog filters. IEEE Trans. Instrum. Meas. 48(4), 798–806 (1999)

3. D. Arbet, J. Brenkus, G. Gyepes, V. Stopjakova, in Increasing the Efficiency of Analog OBIST Using On-Chip Compensation of Technology Variations. IEEE 14th International Symposium Design and Diagnostics Electronic Circuits and Systems, (2011), pp. 71–74

4. D. Arbet, V. Stopjakova, in Influence of the Oscillation Frequency Value on the Efficiency of Oscillation-Based Tests. International Conference on Applied Electronics (2015), pp. 7–10

5. D. Arbet, V. Stopjakova, J. Brenkus, G. Gyepes, M. Kovac, L. Majer, BIST architecture for oscillation test of analog ICs and investigation of test hardware influence. Microelectron. Reliab. 54(5), 985–992 (2014)

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