Models for Power-Aware Testing
Author:
Publisher
Springer Netherlands
Link
http://link.springer.com/content/pdf/10.1007/978-90-481-3282-9_7.pdf
Reference59 articles.
1. Altet J, Rubio A (2002) Thermal testing of integrated circuits. Springer Science, New York
2. Al-Yamani A, Chmelar E, Grinchuck M (May 2005) Segmented addressable scan architecture. In Proceedings of VLSI test symposium, pp 405–411
3. Arabi K, Saleh R, Meng X (May–Jun 2007) Power supply noise in SoCs: metrics, management, and measurement. IEEE Des Test Comput 24(3)
4. Athas WC, Svensson LJ, Koller JG, Tzartzanis N, Chin Chou EG (Dec 1994) Low-power digital systems based on adiabatic-switching principles. IEEE Trans VLSI Sys 2(4):398–416
5. Badereddine N, Wang Z, Girard P, Chakrabarty K, Virazel A, Pravossoudovitch S, Landrault C (Aug 2008) A selective scan slice encoding technique for test data volume and test power reduction. JETTA J Electron Test – Theory Appl 24(4):353–364
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