Depth Resolved Structural Studies in Multilayers Using X-ray Standing Waves
Publisher
Springer-Verlag
Reference34 articles.
1. Sinha K., Sirota E. B., Garoff S. and Stanley H. B., Phys. Rev. B 38 (1988), 2297; Holý V., Kube¡na J., Ohlýdal I., Lischka K. and Plotz W., Phys. Rev. B 47 (1993), 15896. 2. Kingetsu T. and Yamamoto M., Surf. Sci. Rep. 45 (2002), 79; Kortright J. B., Joksch S. and Ziegler E., J. Appl. Phys. 69 (1991), 168. 3. Shan Z. S., Sellmyer D. J., Jaswal S. S., Wang Y. J. and Shen J. X., Phys. Rev. B 42 (1990), 10446; Sato N., J. Appl. Phys. 59 (1986), 2514. 4. de Vries J. J., Kohlhepp J., den Broeder F. J. A., Coehoorn R., Jungblut R., Reinders A. and de Jonge W. J. M., Phys. Rev. Lett. 78 (1997), 3023; Pruneda J. M., Robles R., Bouarab S., Ferrer J. and Vega A., Phys. Rev. B 45 (2001), 024440. 5. Telling N. D., Faunce C. A., Bonder M. J., Grundy P. J., Lord D. G. and Van den Berg J. A., J. Appl. Phys. 89 (2001), 7074.
|
|