EPR and ENDOR investigations of Sn impurities in CdS-Reference-Cited by-同舟云学术

EPR and ENDOR investigations of Sn impurities in CdS

Published:1988-12 Issue:4 Volume:70 Page:491-497
ISSN:0722-3277
Container-title:Zeitschrift f�r Physik B Condensed Matter
language:en
Short-container-title:Z. Physik B - Condensed Matter

Author:

Schultes G.,Hausmann A.,Schamberg F. J.,Roll R.,Niklas J. R.,Spaeth J. M.

Publisher

Springer Science and Business Media LLC

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials,General Materials Science

Link

http://link.springer.com/content/pdf/10.1007/BF01312124.pdf

Reference19 articles.

1. Aven, M., Prener, J.S.: Physics and chemistry of II?VI compounds. Amsterdam: North Holland 1967

2. Norton, H.N.: Sensor and analyzer handbook. Englewood Cliffs: Prentice Hall 1983

3. Bhargava, R.N.: J. Cryst. Growth59, 15 (1982)

4. Bhargava, R.N.: II?VI Semiconductor materials. In: Proceedings of the International Conference of Physics of Semiconductors. Berlin, Heidelberg, New York: Springer 1984

5. Roll, R.: Thesis. RWTH Aachen, FRG 1984

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