Characterization method for new resist formulations for HAR patterns made by X-ray lithography

Author:

Kunka Danays,Mohr Jürgen,Nazmov Vladimir,Meiser Jan,Meyer Pascal,Amberger Maximilian,Koch Frieder,Schulz Joachim,Walter Marco,Duttenhofer Thomas,Voigt Anja,Ahrens Gisela,Grützner Gabi

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference7 articles.

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2. McCord MA, Rooks MJ (2004) Resists in SPIE handbook of microlithography, micromachining and microfabrication. In: Rai-Choudhury (ed) Microlithography, vol 1, Section 2.7

3. Meyer P (2012) Fast and accurate X-ray lithography simulation enabled by using Monte Carlo method. New version of DoseSim: a software dedicated to deep X-ray lithography (LIGA). Microsyst Technol 18(12):1971–1980. doi: 10.1007/s00542-012-1637-3

4. Meyer P, Schulz J, Hahn L (2003) DoseSim: microsoft-Windows graphical user interface for using synchrotron X-ray exposure and subsequent development in the LIGA process. Rev Sci Instrum 74(2):1113–1119. doi: 10.1063/1.1532542

5. Mohr J, Grund T, Kunka D, Kenntner J, Leuthold J, Meiser J, Schulz J, Walter M (2012) High aspect ratio gratings for X-ray phase contrast imaging. AIP Conf Proc 1466:41–50

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