Modeling of chemical mechanical polishing processes by cellular automata and finite element/matlab integration methods

Author:

Chen Kuo-Shen,Wu Shang-Lun,Yeh Hsiu-Ming

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference32 articles.

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3. Chang R, Spanos J (2005) Dishing-radius model of copper CMP dishing effects. IEEE Trans Semicond Manuf 18:297–303

4. Chen K-S and Wu S-L (2013) Modeling of chemical mechanical polishing processes by cellular automata and finite element/matlab integration methods. In: Proc. design, test, integration and packaging of MEMS/MOEMS (DTIP’13). Barcelona, pp 85–88

5. Chen K-S, Yeh H-M, Yan J-L, Chen Y-C (2009) Finite element analysis on wafer level CMP contact stress: re-investigated issues and the effects of selected process parameters. Int J Adv Manuf Technol 42:1118–1130

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