Internal Energy Distribution of Secondary Ions Under Argon and Bismuth Cluster Bombardments: “Soft” Versus “Hard” Desorption–Ionization Process-Reference-Cited by-同舟云学术

Internal Energy Distribution of Secondary Ions Under Argon and Bismuth Cluster Bombardments: “Soft” Versus “Hard” Desorption–Ionization Process

Published:2018-11-12 Issue:2 Volume:30 Page:321-328
ISSN:1044-0305
Container-title:Journal of the American Society for Mass Spectrometry
language:en
Short-container-title:J. Am. Soc. Mass Spectrom.

Author:

Fu Tingting¹²,Della-Negra Serge²,Touboul David¹,Brunelle Alain¹

Affiliation:

1. Institut de Chimie des Substances Naturelles, CNRS UPR 2301, Université Paris-Sud, Université Paris-Saclay, Avenue de la Terrasse, 91198, Gif-sur-Yvette, France

2. Institut de Physique Nucléaire, UMR 8608, IN2P3-CNRS, Université University Paris-Sud, Université Paris-Saclay, 15 rue Georges Clémenceau, 91406, Orsay, France

Funder

Agence Nationale de la Recherche

China Scholarship Council

Publisher

American Chemical Society (ACS)

Subject

Spectroscopy,Structural Biology

Link

http://link.springer.com/article/10.1007/s13361-018-2090-z/fulltext.html

Reference37 articles.

1. Secondary-ion emission of amino acids

2. Surface MS: Probing Real-World Samples