Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering,Cell Biology,Physical and Theoretical Chemistry,Materials Science (miscellaneous),Atomic and Molecular Physics, and Optics,Biotechnology
Reference17 articles.
1. Bazovkin VM, Dvoretsky SA, Guzev AA et al (2016) High operating temperature SWIR p(+)–n FPA based on MBE-grown HgCdTe/Si(013). Infr Phys Technol 76:72–74
2. Bogoboyashchyy VV, Izhnin II, Mynbaev KD (2006) The nature of compositional dependence of p–n junction depth in ion–milled p–HgCdTe. Semicond Sci Technol 21:116–123
3. Bommena R, Ketharanathan S, Wijewarnasuriya PS et al (2015) High-performance MWIR HgCdTe on Si substrate focal plane array development. J Electron Mater 44:3151–3156
4. Bonchyk OYu, Savytskyy HV, Swiatek Z et al (2019) Nano-size defects in arsenic-implanted HgCdTe films: a HRTEM study. Appl Nanosci 9:725–730
5. Dvoretsky SA, Mikhailov NN, Remesnik VG et al (1998) Using reflection spectroscopy for assessing structural perfection of CdTe/GaAs films and CdxHg1−xTe crystals. Avtometriya 5:73–77 (in Russian)
Cited by
5 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献