A one-wavelength, in situ alignment method for rotating analyser ellipsometers
Author:
Publisher
Springer Science and Business Media LLC
Subject
General Engineering,General Physics and Astronomy,Physics and Astronomy (miscellaneous)
Link
http://link.springer.com/content/pdf/10.1007/BF00697289.pdf
Reference3 articles.
1. M.J. Dignam, M. Moskovits: Appl. Opt.9, 1868 (1970)
2. M.R. Steel: Appl. Opt.10, 2370 (1971)
3. J.H.P. Castelijns: Appl. Opt.14, 806 (1975)
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3. An Improvement of Scanning Ellipsometer by Rotating a Polarizer and an Analyzer at a Speed Ratio of 1:3;International Journal of Optomechatronics;2011-03-07
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5. Design of a scanning ellipsometer by synchronous rotation of the polarizer and analyzer;Applied Optics;1994-03-01
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