Investigation of the temperature distribution over the surface of semiconductor infrared radiation sources-Reference-Cited by-同舟云学术

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Investigation of the temperature distribution over the surface of semiconductor infrared radiation sources

Published:1978-06 Issue:6 Volume:21 Page:812-815
ISSN:0038-5697
Container-title:Soviet Physics Journal
language:en
Short-container-title:Soviet Physics Journal

Author:

Zharnikov S. D.,Manak I. S.,Shilov A. F.

Publisher

Springer Science and Business Media LLC

Subject

General Physics and Astronomy,General Physics and Astronomy

Link

http://link.springer.com/content/pdf/10.1007/BF00936699.pdf

Reference12 articles.

1. S. Mayburg, J. Appl. Phys.,34, No. 11, 3417 (1963).

2. R. W. Keyes, IBM J. Res. Develop.,9, No. 4, 303 (1965).

3. D. N. Nasledov, A. A. Rogachev, S. M. Ryvkin, and B. V. Tsarenkov, Fiz. Tverd. Tela, No. 4, 1062 (1962).

4. G. Burns, F. H. Dill, and M. I. Nathan, Proc. IEEE,51, No. 6, 947 (1963).

5. V. S. Bagaev, Yu. N. Berozashvili, V. S. Ivanov, B. D. Kopylovskii, and Yu. N. Korolev, Prib. Tekh. Eksp., No. 4, 185 (1966).

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