A realistic defect oriented testability methodology for analog circuits
Author:
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Link
http://link.springer.com/content/pdf/10.1007/BF00996436.pdf
Reference40 articles.
1. P. Duhamel and J.C. Rault, ?Automatic Test Generation Techniques for Analog Circuits and Systems: A Review,?IEEE Transactions on Circuits and Systems, Vol. CAS-26, No. 7, pp. 411?440, 1979.
2. M. Slamani and B. Kaminska, ?Analog Circuit Fault Diagnosis Based on Sensitivity Computation and Functional Testing,?IEEE Design and Test of Computers, pp. 30?39, March 1992.
3. A. Walker, W.E. Alexander, and P. Lala, ?Fault Diagnosis in Analog Circuits Using Elemental Modulation,?IEEE Design and Test of Computers, pp. 19?29, March 1992.
4. B.R. Epstein, M. Czigler, and S.R. Miller, ?Fault Detection and Classification in Linear Integrated Circuits: An Application of Discrimination Analysis and Hypothesis Testing,?IEEE Trans. on Computer Aided Design of Integrated Circuits and Systems, Vol. 12, No. 1, pp. 102?112, 1993.
5. N.J. Elias, ?The Application of Statistical Simulation to Automated the Analog Test Development,?IEEE Transactions on Circuits and Systems, Vol. CAS-26, No. 7, pp. 513?517, 1979.
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