Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Cited by
6 articles.
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1. Defect Oriented Analog Testing;Defect Oriented Testing for CMOS Analog and Digital Circuits;1999
2. A realistic defect oriented testability methodology for analog circuits;Journal of Electronic Testing;1995-06
3. Generic Approaches to the Design of Network Services Circuits;AT&T Bell Laboratories Technical Journal;1984-05-06
4. A sensitivity-based approach to tolerance assignment;IEE Proceedings G (Electronic Circuits and Systems);1982
5. Specification sensitivity and its use in system design;IEE Proceedings G (Electronic Circuits and Systems);1982