Author:
Dargham Jamal Ahmad,Chekima Ali,Moung Ervin,Omatu Sigeru
Publisher
Springer Science and Business Media LLC
Subject
Artificial Intelligence,General Biochemistry, Genetics and Molecular Biology
Reference7 articles.
1. Turk M, Pentland A (1991) Eigenfaces for recognition. J Cognitive Neurosci 3(1):71–86
2. Chunming L, Yanhua D, Hongtao M, et al (2008) A statistical PCA method for face recognition. In: Intelligent information technology application. IITA 2008. 2nd International Symposium, vol 3, pp 376–380
3. Abdul KJ, Rubiyah Y, Marzuki K (2008.) Investigate the performance of a Fuzzy ArtMap classifier for face recognition system. Signal Image Technology and Internet-Based Systems, SITIS’ 08. IEEE International Conference, November 30, 2008 to December 3, 2008, pp 254–259
4. Jadhao DV, Holambe RS (2007) Feature extraction and dimensionality reduction using Radon and Fourier transforms with application to face recognition. In: International Conference on Computational Intelligence and Multimedia Applications. vol 2, 13–15 December, pp 254–260
5. Dabbah M, Dlay SS, Woo WL (2008) Randomized Radon signature for face biometric verification. Image Processing, 2008, ICIP 2008, 15th IEEE International Conference, pp 273–276
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