Author:
Krynicki J.,Bourgoin J. C.
Publisher
Springer Science and Business Media LLC
Subject
General Materials Science,General Chemistry,General Engineering
Reference21 articles.
1. See, for instance, F. L. Vook: InRadiation Damage and Defects in Semiconductors (The Institute of Physics, London 1973) Conf. Ser. no 16, p. 60
2. H.J. Stein, F.L. Vook, J.A. Borders: Appl. Phys. Lett.14, 328 (1969). Also: H.J. Stein: InIon Implantation in Semiconductors, ed. by F. Chernow, J.A. Borders and D.K. Brice (Plenum Press, New York 1976) p. 401
3. K.L. Wang: Appl Phys. Lett.29, 700 (1971)
4. W.W. Chan, C.T. Sah: J. Appl. Phys.42, 4768 (1971)
5. F. Richou, G. Pelous, D. Lecrosnier: Appl. Phys. Lett.31, 525 (1977)
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