Transmission EBSD (t-EBSD) as Tool to Investigate Nanostructures in Superconductors
Author:
Funder
DFG
Publisher
Springer Science and Business Media LLC
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://link.springer.com/content/pdf/10.1007/s10948-019-5106-4.pdf
Reference29 articles.
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2. Dingley, D.: Progressive steps in the development of electron backscatter diffraction and orientation imaging microscopy. J. Microsc. 213, 214–224 (2004)
3. Chen, D., Kuo, J.-C., Wu, W.-T.: Effect of microscopic parameters on EBSD spatial resolution. Ultramicroscopy 111, 1488–1494 (2011)
4. Koblischka, M.R., Koblischka-Veneva, A.: Applications of the electron backscatter diffraction technique to ceramic materials. Phase Transit. 86, 651–660 (2013)
5. Trimby, P.W.: Orientation mapping of nanostructured materials using transmission Kikuchi diffraction in the scanning electron microscope. Ultramicroscopy 120, 16–24 (2012)
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1. Residual Stress/Strain Analysis of Bulk YBCO Superconductors Using EBSD;IEEE Transactions on Applied Superconductivity;2022-06
2. Highly Porous Superconductors: Synthesis, Research, and Prospects;Physics of Metals and Metallography;2020-10
3. Secondary phase particles in bulk, infiltration-growth processed YBCO investigated by transmission Kikuchi diffraction and TEM;Superconductor Science and Technology;2020-02-12
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