Effect of microscopic parameters on EBSD spatial resolution-Reference-Cited by-同舟云学术

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Effect of microscopic parameters on EBSD spatial resolution

Published:2011-08 Issue:9-10 Volume:111 Page:1488-1494
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Chen Delphic,Kuo Jui-Chao,Wu Wen-Tuan

Funder

National Science Council of the Republic of China

Center for Micro/Nano Science and Technology

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference23 articles.

1. Resolution and sensitivity of electron backscattered diffraction in a cold field emission gun SEM;Isabell;Ultramicroscopy,1997

2. Progressive steps in the development of electron backscatter diffraction and orientation imaging microscopy;Dingley;J. Microsc.,2004

3. Exploring spatial resolution in electron back-scattered diffraction experiments via Monte Carlo simulation;Ren;Microsc. Microanal.,1998

4. Characterisation of fine-scale microstructures by electron backscatter diffraction (EBSD);Humphreys;Scr. Mater.,2004

5. Present state of electron backscatter diffraction and prospective developments;Schwarzer,2009

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