Specific conductivity measurements on non-homogeneous semiconductor samples-Reference-Cited by-同舟云学术

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Specific conductivity measurements on non-homogeneous semiconductor samples

Published:1975-03 Issue:2 Volume:6 Page:189-197
ISSN:0340-3793
Container-title:Applied physics
language:en
Short-container-title:Appl. Phys.

Author:

De Mey G.

Publisher

Springer Science and Business Media LLC

Subject

General Materials Science,General Chemistry,General Engineering

Link

http://link.springer.com/content/pdf/10.1007/BF00883751.pdf

Reference14 articles.

1. L. J. Van der Pauw: Philips Res. Reports13, 1 (1958)

2. J. Lange: J. Appl. Phys.35, 2654 (1964)

3. A. Mircea: Solid State Electr.6, 459 (1963)

4. M. J. Reber: Solid State Electr.7, 525 (1964)

5. H. H. Wieder: Intermetallic Semiconducting Films (Pergamon Press, London 1970)

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Conductivity fluctuations in planar resistors;Applied Physics A Solids and Surfaces;1987-06

2. A STOCHASTIC ANALYSIS OF EDGE EFFECTS ON PLANAR RESISTORS;COMPEL - The international journal for computation and mathematics in electrical and electronic engineering;1987-04

3. Contact versus bulk noise in resistive layers;Applied Physics A Solids and Surfaces;1985-04

4. A stochastic model for the electrical conduction in non homogeneous layers;Stochastic Control Theory and Stochastic Differential Systems;1979

5. A second-order perturbation method for potential calculations in non-homogeneous conducting layers;Applied physics;1977-02

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