Contact versus bulk noise in resistive layers-Reference-Cited by-同舟云学术

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Contact versus bulk noise in resistive layers

Published:1985-04 Issue:4 Volume:36 Page:183-187
ISSN:0721-7250
Container-title:Applied Physics A Solids and Surfaces
language:en
Short-container-title:Appl. Phys. A

Author:

Mey G.

Publisher

Springer Science and Business Media LLC

Subject

General Materials Science,General Chemistry,Physics and Astronomy (miscellaneous),General Engineering,General Materials Science

Link

http://link.springer.com/content/pdf/10.1007/BF00616550.pdf

Reference7 articles.

1. W. Van Bokhoven: Arch. Elektr. �bertragungstech.32, 349?352 (1978)

2. L. Vandamme, W. Van Bokhoven: Appl. Phys.14, 205?215 (1977)

3. S. Demolder, A. Van Calster, M. Vandendriessche: Current noise in thick and thin film resistors. Proc. 3rd Europ. Hybrid Microelectronics Conference, Avignon (1981) pp. 19?25

4. G. De Mey; Appl. Phys.6, 189?197 (1975)

5. E.N. Economon:Green's Functions in Quantum Physics, 2nd edn., Springer Ser. Solid-State Sci.7 (Springer, Berlin, Heidelberg 1983)

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Comments on "An exact formula for the effects of resistor geometry on current noise";IEEE Transactions on Electron Devices;1987-08

2. Conductivity fluctuations in planar resistors;Applied Physics A Solids and Surfaces;1987-06

3. Comments on "An exact formula for the effects of resistor geometry on current noise";IEEE Transactions on Electron Devices;1986-11

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