Improving the testability of switched-capacitor filters

Author:

Huertas J. L.,Rueda A.,V�zquez D.

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering

Reference19 articles.

1. P. Duhamel and J. C. Rault, ?Automatic test generation techniques for analog circuits and systems: a review,?IEEE Trans. Circuits Syst., Vol. 26, pp. 411?440, 1979.

2. J.W. Bandler and A.E. Salama, ?Fault diagnosis of analog circuits,?IEEE Proc., Vol. 73, pp. 1279?325, 1985.

3. R. Liu, ed.,Testing and Diagnosis of Analog Circuits and Systems, Van Nostrand Reinhold: New York, 1991.

4. K.D. Wagner and T.W. Williams, ?Design for testability of mixed-signal integrated circuits,?Proc. IEEE 1988 Int. Test Conf., pp. 823?828, 1988.

5. P.P. Fasang, D. Mullins, and T. Wong: ?Design for testability for mixed analog/digital ASICs,? inProc. IEEE 1988 Custom Integrated Circuit Conf., pp. 16.5.1?16.5.4, 1988.

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