A Multi-Mode Signature Analyzer for Analog and Mixed Circuits-Reference-Cited by-同舟云学术

A Multi-Mode Signature Analyzer for Analog and Mixed Circuits

Published:1997 Issue: Volume: Page:65-76
ISSN:
Container-title:VLSI: Integrated Systems on Silicon
language:
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Author:

Renovell M.,Lubaszewski M.,Mir S.,Azais F.,Bertrand Y.

Publisher

Springer US

Link

http://link.springer.com/content/pdf/10.1007/978-0-387-35311-1_6

Reference17 articles.

1. M.A. Al—Qutayri and P.R. Shepherd (1992), `Go/No—Go Testing of Analog Macros’, IEE Circuits Devices Syst, Vol. 139, No. 4, pp. 534–540.

2. K. Arabi and B. Kaminska (1996), `Oscillation-Test Strategy for Analog and Mixed-Signal Integrated “, 14th VLSI Test Symp., Princeton, USA, pp. 476–482.

3. P.S. Evans, M.A. Al—Qutayri and P.R. Shepherd (1990), `On the Development of Transient Response Testing Techniques for Mixed—Mode ICs’, Journal of Semicustom ICs, Vol. 8, No. 2, pp. 34–38.

4. R. Gregorian and G.C. Ternes (1995). Analog MOS Integral Cir. for Signal Process., John Wiley und Sons, 1986.

5. J.L. Huertas, A. Rueda and D. Vazquez (1993), `Improving the Testability of Switched-Capacitor Filters’, J. Electron. Testing: Theory and Appl., Vol. 4, No. 4, pp. 299–313.

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