A novel fault diagnosis method for analog circuits with noise immunity and generalization ability
Author:
Publisher
Springer Science and Business Media LLC
Subject
Artificial Intelligence,Software
Link
https://link.springer.com/content/pdf/10.1007/s00521-021-05810-4.pdf
Reference32 articles.
1. Gao T, Yang J, Jiang S, Yang C (2019) A novel fault diagnostic method for analog circuits using frequency response features. Rev Sci Instrum 90:104708
2. Binu D, Shida KBS (2019) RideNN: a new rider optimization algorithm-based neural network for fault diagnosis in analog circuits. IEEE Trans Instrum Meas 68:2–26
3. Yang C, Yang J, Liu Z, Tian S (2014) Complex field fault modeling-based optimal frequency selection in linear analog circuit fault diagnosis. IEEE Trans Instrum Meas 63:813–825
4. Tadeusiewicz M, Halgas S (2018) A method for local parametric fault diagnosis of a broad class of analog integrated circuits. IEEE Trans Instrum Meas 67:328–337
5. Yang C, Liu Z, Hu C (2019) Fault diagnosis of analog filter circuit based on genetic algorithm. IEEE Access 7:54969–54980
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