A model-based prognostic approach to predict interconnect failure using impedance analysis

Author:

Kwon Daeil,Yoon Jeongah

Publisher

Springer Science and Business Media LLC

Subject

Mechanical Engineering,Mechanics of Materials

Reference22 articles.

1. D. Kwon, M. H. Azarian and M. Pecht, Early detection of interconnect degradation by continuous monitoring of RF impedance, Device and Materials Reliability, IEEE Transactions, 9 (2009) 296–304.

2. D. Kwon, M. H. Azarian and M. Pecht, Detection of solder joint degradation using RF impedance analysis, IEEE Electronic Components Technology Conference, Lake Buena Vista, FL (2008).

3. D. Kwon, M. H. Azarian and M. Pecht, Detection of Solder joint failure precursors on tin-lead and lead-free assemblies using RF impedance analysis, IEEE Electronic Components and Technology Conference, San Diego, CA (2009).

4. O. E. Dragomir, R. Gouriveau, F. Dragomir, E. Minca and N. Zerhouni, Review of prognostic problem in condition-based maintenance, Control Conference (ECC), 2009 European (2009) 1587–1592.

5. J. M. Y. J. Zhu, D. He, Y. Qu and E. Bechhoefer, Lubrication oil condition monitoring and remaining useful life prediction with particle filtering, Prognostics and Health Management Society (2013).

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