Modeling the SOI MOSFET nonlinearities. An empirical approach
Author:
Parvais B.,Siligaris A.
Publisher
Springer Netherlands
Cited by
1 articles.
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1. Linearity Assessment of GaN HEMTs on Si using Nonlinear Characterisation;2021 16th European Microwave Integrated Circuits Conference (EuMIC);2022-04-03