Ion scattering spectroscopy and scanning tunneling microscopy: A powerful combination for surface structure analysis

Author:

Niehus H.

Publisher

Springer Science and Business Media LLC

Subject

General Materials Science,General Chemistry,Physics and Astronomy (miscellaneous),General Engineering,General Materials Science

Reference59 articles.

1. G. Binnig, H. Rohrer, Ch. Gerber, E. Weibel: Phys. Rev. Lett. 49, 57 (1982)

2. Proc. Second Int. Conf. on STM, J. Vac. Sci. Technol. A 6 (1988), see also, Proc. Third Int. Conf. on STM, J. Microscopy 152 (1988) and also Proc. Fourth Int. Conf. on STM, J. Vac. Sci. Technol. A 8 (1990)

3. NATO ASI SERIES E: Applied Science,1990

4. For recent review articles see E. Taglauer: In Methods of Surface Characterization, Vol. 2. ed. by A.W. Czanderna, D.M. Hercules (Plenum, New York 1991)

5. H. Niehus: In Practical Surface Analysis by Ion and Neutral Spectroscopy, Vol. 2 (Wiley, Chichester 1991)

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