Quantitative layer analysis of single crystal surfaces by LEIS
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference20 articles.
1. Low-energy ion scattering at surfaces
2. Element-, time- and spatially-resolved images of scattered and recoiled atoms
3. Shadowing and focusing effects in the angular distributions of low-energy rare-gas ions scattered from solid surfaces
4. Compositional changes in the surface layers of the Cu3Au(100) below the bulk transition temperature
5. Ion scattering spectroscopy and scanning tunneling microscopy: A powerful combination for surface structure analysis
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