Detection of coupling faults in RAMs-Reference-Cited by-同舟云学术

Detection of coupling faults in RAMs

Published:1990-05 Issue:2 Volume:1 Page:151-162
ISSN:0923-8174
Container-title:Journal of Electronic Testing
language:en
Short-container-title:J Electron Test

Author:

Brzozowski J. A.,Cockburn B. F.

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering

Link

http://link.springer.com/content/pdf/10.1007/BF00137391.pdf

Reference13 articles.

1. S.M. Thatte, ?Fault diagnosis of semiconductor random access memories,? Report R-769, Coordinated Science Laboratory, University of Illinois, May 1977.

2. D.S. Suk and S.M. Reddy, ?A march test for functional faults in semiconductor random access memories,? IEEE Trans. Comput. C-30(12):982?985, 1981.

3. R. Dekker, ?Fault modeling and self-test of static random access memories,? Master's thesis, Rep. No. 1-68340-28(1987)25, Department of Electrical Engineering, Delft University of Technology, September 1987.

4. E.D. Colbourne, G.R Coverley, and S.K. Behera, ?Reliability of MOS LSI circuits,? Proc. IEEE 62(2):244?259, 1974.

5. J. Cocking, ?RAM test patterns and test strategy,? Digest of Papers of the 1975 Semiconductor Test Symposium, Cherry Hill, NJ, IEEE Computer Society, pp. 1?8, 1975.

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