1. S. DasGupta, C. R. P. H, artmann, and L. D. Rudolph, “Dual-mode logic for function-independent fault testing,” IEEE Trans. Comput., C-29(11), 1025–1029 (1980).
2. E. V. Dubrova and J. C. Muzio, “Generalized Reed–Muller canonical form for a multiple-valued algebra,” Multiple-Valued Logic, 1, 104–109 (1996).
3. H. Inose and M. Sakauchi, “Synthesis of automatic fault diagnosable logical circuits by function conver-sion method,” in: Proc. First USA-Japan Computer Conf. (1972), pp. 426–430.
4. Zh. Pan, “Fault detection for testable realizations of multiple-valued logic functions,” in: The 12th Asian Test Symposium (ATS 2003), IEEE (2003), pp. 242–247.
5. Zh. Pan, “Circuit testable design and universal test sets for multiple-valued logic functions,” J. of Electronics (China), 24, No. 1, 138–144 (2007).