Run-to-run control of inductively coupled C2F6 plasma etching of SiO2: Multivariable controller design and numerical application
Author:
Publisher
Springer Science and Business Media LLC
Subject
General Chemical Engineering,General Chemistry
Link
http://link.springer.com/content/pdf/10.1007/BF02705716.pdf
Reference10 articles.
1. Badgwell, T. A., Breedijk, S. G., Bushman, S. G., Butler, S. W., Chatterjee, S., Edgar, T. F., Toprac, A. J. and Trachtenberg, I., “Modeling and control of microelectronics materials processing,”Comp. & Chem. Eng.,19, 1 (1995).
2. Edgar, T. F., Butler, S. W., Campbell, W. J., Pfeiffer, C., Bode, C., Hwang, S. B., Balakrishnan, K. S. and Hahn, J., “Automatic control in micro-electronics manufacturing: practice, challenges, and possibilities,”Automatica,36, 1567 (2000).
3. Hankinson, M., Vincent, T. and Irani, K. B., “Integrated real-time and R2R control of etch depth in reactive ion etching,”IEEE Trans. Semi-conduct. Manufact.,10, 121 (1997).
4. Kim, B. W., Kim, S. M. and Kim, K. H., “Modeling of plasma etching using a generalized regression neural network,”Vacuum,71, 497 (2003).
5. Kim, W. C., Chin, I. S., Lee, K. S. and Choi, J. H., “Analysis and reduced-order design of quadratic criterion-based iterative learning control using singular value decomposition,”Comp. & Chem. Eng.,24, 1815 (2000).
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3. DEVELOPMENT OF ENDPOINT DETECTION ALGORITHM IN THE MULTI-STEP PLASMA ETCHING PROCESS;IFAC Proceedings Volumes;2007
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