Investigation of Solid-Liquid Interface Effects on the Impurity Concentration in the DS Grown Mc-Si Ingot by using C-Clamp Insulation Block for Solar Cell Applications: Numerical Analysis
Author:
Publisher
Springer Science and Business Media LLC
Subject
Electronic, Optical and Magnetic Materials
Link
https://link.springer.com/content/pdf/10.1007/s12633-023-02839-z.pdf
Reference36 articles.
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2. Sugunraj S, Kumar MA, Keerthivasan T, Srinivasan M, Arivanandhan M, Nallusamy N, Ramasamy P (2022) Analysis of grain structures and impurity distribution in mc-silicon grown by directional solidification: Computational and experimental approach. Appl Surf Sci Adv 12:100346
3. Wen S, Jiang D, Shi S, Tan Y, Li P, Gu Z, Zhang X (2016) Determination and controlling of crystal growth rate during silicon purification by directional solidification. Vacuum 125:75–80
4. Bharathwaj M, Sugunraj S, Karuppasamy P, Srinivasan M, Ramasamy P (2023) Effect of argon flow rate on mc-silicon ingot grown by DS process for PV application: a numerical investigation of non-metallic impurities. Silicon. https://doi.org/10.1007/s12633-023-02490-8
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1. Numerical Investigation of Argon Gas Flow Patterns and Their Effects on Mc-Si Ingot Growth Process: Solar Cell Applications;Silicon;2024-03-04
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