Assessing the Impact of Drain Underlap Perspective Approach to Investigate DC/RF to Linearity Behavior of L-Shaped TFET
Author:
Publisher
Springer Science and Business Media LLC
Subject
Electronic, Optical and Magnetic Materials
Link
https://link.springer.com/content/pdf/10.1007/s12633-022-01814-4.pdf
Reference38 articles.
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3. Datta S., Liu H., Narayanan V. (2014) Tunnel fet technology: A reliability perspective. Microelectron Reliab 54(5):861– 874
4. Kumar N., Raman A. (2020) Prospective sensing applications of novel heteromaterial based dopingless nanowire-tfet at low operating voltage. IEEE Trans Nanotechnol 19:527–534
5. Singh P., Yadav D.S. (2021) Design and investigation of f-shaped tunnel fet with enhanced analog/rf parameters. Silicon
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