Analytical Modeling of Trap Charges Induced Dual Metal Junctionless Accumulation Mode Nanowire FET (DM-JAM-NWFET)
Author:
Publisher
Springer Science and Business Media LLC
Subject
Electronic, Optical and Magnetic Materials
Link
https://link.springer.com/content/pdf/10.1007/s12633-021-01402-y.pdf
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