A Numerical Investigation of Heat Suppression in HEMT for Power Electronics Application
Author:
Publisher
Springer Science and Business Media LLC
Subject
Electronic, Optical and Magnetic Materials
Link
https://link.springer.com/content/pdf/10.1007/s12633-020-00647-3.pdf
Reference50 articles.
1. Saito W, Takada Y, Kuraguchi M, Tsuda K, Omura I, Ogura T, Ohashi H (2003) High breakdown voltage AlGaN–GaN power-HEMT design and high current density switching behavior. IEEE Trans On Electron Devices 50(12):2528–2535
2. Ahsan SA, Ghosh S, Sharma K, Dasgupta A, Khandelwal S, Chauhan YS (2016) Capacitance modeling in dual field-plate power GaN HEMT for accurate switching behavior. IEEE Trans Electron Devices 63(2):565–572
3. Joshi V, Soni A, Tiwari SP, Senior Member IEEE, Shrivastava M, Senior Member IEEE (2016) A comprehensive computational modeling approach for AlGaN/GaN HEMTs. IEEETrans Nanotechnol 15(6):947–955
4. Susai Lawrence Selvaraj, Takaaki Suzue, and Takashi Egawa (2009) Breakdown Enhancement of AlGaN/GaN HEMTs on 4-in Silicon by Improving the GaN Quality on Thick Buffer Layers. IEEE Electron Device Lett 30 (6)
5. Lu B (2010) Student Member, IEEE, and Tomás Palacios, “High Breakdown (> 1500 V) AlGaN/GaN HEMTs by Substrate-Transfer Technology,”. IEEE Electron Device Lett 31(9):951–957
Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Partial etched AlGaN layer on p-GaN HEMT with gate field plate and drain field plate for channel temperature reduction;2022 19th China International Forum on Solid State Lighting & 2022 8th International Forum on Wide Bandgap Semiconductors (SSLCHINA: IFWS);2023-02-07
2. Ballistic Thermal Transport at Sub‐10 nm Laser‐Induced Hot Spots in GaN Crystal;Advanced Science;2022-11-17
3. Thermal Performance Improvement of AlGaN/GaN HEMTs Using Nanocrystalline Diamond Capping Layers;Micromachines;2022-09-07
4. Analysis and improvement of self-heating effect based on GaN HEMT devices;Materials Research Express;2022-07-01
5. Access Region Stack Engineering for Mitigation of Degradation in AlGaN/GaN HEMTs With Field Plate;IEEE Transactions on Device and Materials Reliability;2022-03
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3