Performance Tuning and Reliability Analysis of the Electrostatically Configured Nanotube Tunnel FET with Impact of Interface Trap Charges
Author:
Publisher
Springer Science and Business Media LLC
Subject
Electronic, Optical and Magnetic Materials
Link
https://link.springer.com/content/pdf/10.1007/s12633-020-00777-8.pdf
Reference40 articles.
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1. Design Considerations and Optimization of Electrostatic Doped Ferroelectric Nanotube Tunnel FET: Analog and Noise Analysis;Silicon;2022-03-03
2. Performance Enhancement and Signal Distortion Analysis of Virtually Doped Nanotube Tunnel FET with Embedded Ferroelectric Gate Oxide;Silicon;2021-01-06
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