A FinBOX Based Ge FinEHBTFET: Design and Investigation
Author:
Publisher
Springer Science and Business Media LLC
Subject
Electronic, Optical and Magnetic Materials
Link
http://link.springer.com/content/pdf/10.1007/s12633-021-01006-6.pdf
Reference34 articles.
1. Taur Y (2002) CMOS design near the limit of scaling. IBM J Res Dev 46(2.3):213–222
2. Sun S-W, Tsui PGY (1995) Limitation of CMOS supply-voltage scaling by MOSFET threshold-voltage variation. IEEE J Solid-State Circ 30(8):947–949
3. Wang J, Lundstrom M (2002) Does source-to-drain tunneling limit the ultimate scaling of MOSFETs?, Digest. International Electron Devices Meeting,, San Francisco, 707–710
4. Frank DJ, Dennard RH, Nowak E, Solomon PM, Taur Y, Wong H-SP (2001) Device scaling limits of Si MOSFETs and their application dependencies. Proc IEEE 89(3):259–288
5. Zhai B, Blaauw D, Sylvester D, Falutner K (2004) Theoretical and Practical Limits of Dynamic Voltage Scaling, in Proceedings of the 41st annual Design Automation Conference, San Diego, CA, USA, 868–873
Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. An InGaAs-based Fin-EHBTFET with a heterogate and barrier layer for high performance;Japanese Journal of Applied Physics;2024-06-03
2. Charge-plasma-based inverted T-shaped source-metal dual-line tunneling FET with improved performance at 0.5 V operation;Physica Scripta;2023-08-09
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