Effect of Intrinsic and Extrinsic Defects on the Structural, Thermal, and Electrical Properties in p-Type CZ-Si Wafers with Different Carrier Concentrations-Reference-Cited by-同舟云学术

Effect of Intrinsic and Extrinsic Defects on the Structural, Thermal, and Electrical Properties in p-Type CZ-Si Wafers with Different Carrier Concentrations

Published:2022-10-13 Issue:12 Volume:43 Page:
ISSN:0195-928X
Container-title:International Journal of Thermophysics
language:en
Short-container-title:Int J Thermophys

Author:

Martinez-Hernandez Harol D.,Martinez-Munoz Porfirio E.,Ramirez-Gutierrez Cristian F.,Martinez-Ascencio Eduardo U.,Millan-Malo Beatriz M.,Rodriguez-Garcia Mario E.

Publisher

Springer Science and Business Media LLC

Subject

Condensed Matter Physics

Link

https://link.springer.com/content/pdf/10.1007/s10765-022-03110-0.pdf

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